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Selahattin Sayil
Contactless VLSI Measurement and Testing Techniques
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3649585Contactless VLSI Measurement and Testing Techniqueshttps://www.gandhi.com.mx/contactless-vlsi-measurement-and-testing-techniques-9783319696737/phttps://gandhi.vtexassets.com/arquivos/ids/2452349/06c250a9-e02b-4461-b3dc-a7acc80283a7.jpg?v=63838399493453000017321925MXNSpringer International PublishingInStock/Ebooks/<p>This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing. The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing. The techniques described in this book address the increasing demands for internal access of the logic state of a node within a chip under test.</p>...3585529Contactless VLSI Measurement and Testing Techniques17321925https://www.gandhi.com.mx/contactless-vlsi-measurement-and-testing-techniques-9783319696737/phttps://gandhi.vtexassets.com/arquivos/ids/2452349/06c250a9-e02b-4461-b3dc-a7acc80283a7.jpg?v=638383994934530000InStockMXN99999DIEbook20179783319696737_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_<p>This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing. The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing. The techniques described in this book address the increasing demands for internal access of the logic state of a node within a chip under test.</p>9783319696737_Springer International Publishinglibro_electonico_aa17e8b1-bd6f-3812-af19-ef15db292e8f_9783319696737;9783319696737_9783319696737Selahattin SayilInglésMéxico2017-11-16T00:00:00+00:00Springer International Publishing