Envío gratis siempre a todo México.
Haz clic para hacer zoom
Not Available
Richard Leach
Fundamental Principles of Engineering Nanometrology
Cargando comentarios…
Comparte
$0
(IVA Incluido)
Envío gratis siempre
Comentarios
Cargando el resumen…
Cargando comentarios…
product
4137635Fundamental Principles of Engineering Nanometrologyhttps://www.gandhi.com.mx/fundamental-principles-of-engineering-nanometrology-9781437778328/phttps://gandhi.vtexassets.com/arquivos/ids/2894300/767c49de-cd9b-4be3-a5ae-7f0b9ebe98d7.jpg?v=638384595967300000MXNGandhiOutOfStock/Ebooks/<p>Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study. - Provides a basic introduction to measurement and instruments - Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force - Covers multiple optical surface measuring instruments and related topics (interferometry, triangulation, confocal, variable focus, and scattering instruments) - Explains, in depth, the calibration of surface topography measuring instruments (traceability; calibration of profile and areal surface texture measuring instruments; uncertainties) - Discusses the material in a way that is comprehensible to even those with only a limited mathematical knowledge</p>...4073112Fundamental Principles of Engineering Nanometrology00https://www.gandhi.com.mx/fundamental-principles-of-engineering-nanometrology-9781437778328/phttps://gandhi.vtexassets.com/arquivos/ids/2894300/767c49de-cd9b-4be3-a5ae-7f0b9ebe98d7.jpg?v=638384595967300000OutOfStockMXN0DIEbook20099781437778328_W3siaWQiOiJkYzRiZjNmOC0xM2JiLTQxZGItYTg2Zi1jYzg0NzdkNDA3NGQiLCJsaXN0UHJpY2UiOjIxMjcsImRpc2NvdW50IjoyMTMsInNlbGxpbmdQcmljZSI6MTkxNCwiaW5jbHVkZXNUYXgiOnRydWUsInByaWNlVHlwZSI6Ildob2xlc2FsZSIsImN1cnJlbmN5IjoiTVhOIiwiZnJvbSI6IjIwMjUtMDEtMDhUMTY6MDA6MDBaIiwicmVnaW9uIjoiTVgiLCJpc1ByZW9yZGVyIjpmYWxzZX1d9781437778328_<p><em>Fundamental Principles of Engineering Nanometrology</em> provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study.</p><ul><li>Provides a basic introduction to measurement and instruments</li><li>Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force</li><li>Covers multiple optical surface measuring instruments and related topics (interferometry, triangulation, confocal, variable focus, and scattering instruments)</li><li>Explains, in depth, the calibration of surface topography measuring instruments (traceability; calibration of profile and areal surface texture measuring instruments; uncertainties)</li><li>Discusses the material in a way that is comprehensible to even those with only a limited mathematical knowledge</li></ul>(*_*)9781437778328_<p><em>Fundamental Principles of Engineering Nanometrology</em> provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study.</p><ul><li>Provides a basic introduction to measurement and instruments</li><li>Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force</li><li>Covers multiple optical surface measuring instruments and related topics (interferometry, triangulation, confocal, variable focus, and scattering instruments)</li><li>Explains, in depth, the calibration of surface topography measuring instruments (traceability; calibration of profile and areal surface texture measuring instruments; uncertainties)</li><li>Discusses the material in a way that is comprehensible to even those with only a limited mathematical knowledge</li></ul>...(*_*)9781437778328_<p>Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study. - Provides a basic introduction to measurement and instruments - Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force - Covers multiple optical surface measuring instruments and related topics (interferometry, triangulation, confocal, variable focus, and scattering instruments) - Explains, in depth, the calibration of surface topography measuring instruments (traceability; calibration of profile and areal surface texture measuring instruments; uncertainties) - Discusses the material in a way that is comprehensible to even those with only a limited mathematical knowledge</p>...9781437778328_Elsevier Science(*_*)9781437778328_William Andrewlibro_electonico_b8e9e81d-3d78-47b9-8c58-10d2c46a34ec_9781437778328;9781437778328_9781437778328Richard LeachInglésMéxicoWilliam Andrewhttps://getbook.kobo.com/koboid-prod-public/elsevierrefmonographs-epub-397bc20d-3cec-40f6-937c-fc0b447a16d5.epub2009-09-03T00:00:00+00:00